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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cl
Formula:
CuCl
Name:
copper(I) chloride
CAS Registry No:
7758-89-6
Class:
chloride, II-VI semiconductor

Citation:
Author Name(s):
Vasquez R.P.
Journal:
Surf. Sci. Spectra 2, 138
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p1/2
Binding Energy (eV)
200.80
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
1.0
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The powder was pressed into In foil. Emission angle = 55 degrees. The intensity ratio of the Gaussian/Lorentzian components was 60/40. FAT mode. The composition determined by XPS was Cu0.333Cl0.370.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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