NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 17

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

NiO

L₂VV

866.60

NiO

L₂VV

861.00

NiO

L₃VV

849.70

NiO

L₃VV

842.90

NiO

2p_1/2, sat

879.10

NiO

2p_1/2, sat

881.80

NiO

66.80

NiO

3p, sat

72.60

NiO

111.60

NiO

3s, sat

118.20

NiO

529.40

NiO

2p_3/2

854.40

NiO

2p_3/2

856.50

NiO

2p_3/2, sat

861.50

NiO

2p_3/2, sat

864.10

NiO

2p_1/2

871.90

NiO

2p_1/2

873.80

Data Processing:

Auger-Electron Line

L₂VV

866.60

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

4.31

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu 3p3, 2p3 = 75.13, 932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was Ni31.4O37.6. FAT mode. Emission angle = 45 degrees. The relative intensity was 0.55. There are two peaks in the Ni L2VV Auger spectrum.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300