NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 4

Data Processing:

Chemical Shift

CS-2p_3/2

0.40

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

2 ML Fe were deposited onto Si(100)-(2x1) and annealed (T = 630 K, time = 20 min). The substrate was cleaned by Ar+ ion bombardment and rapid thermal annealing by electron beam heating ( T = 1500 - 1600 K). rapid thermal annealing by electron beam heating ( T = 1500 - 1600 K).

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300