NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 41

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

3p, sat

71.32

3p, sat

78.11

3p_3/2

65.69

3p_1/2

67.00

3p, sat

71.29

3p, sat

78.08

3p_1/2

66.89

3p, sat

71.18

3p, sat

78.10

3p_3/2

65.68

3p_1/2

67.00

2p_1/2, sat

874.89

2p_3/2

852.81

2p_3/2, sat

858.23

2p_1/2

870.18

2p_1/2, sat

874.93

3p_3/2

65.66

2p_3/2, sat

858.27

2p_1/2

870.15

2p_1/2, sat

874.97

2p_3/2

852.80

2p_3/2, sat

858.21

2p_1/2

870.17

1008.20

2p_3/2

852.76

2p_3/2, sat

858.36

2p_1/2

870.13

2p_1/2, sat

874.90

2p_3/2

852.80

110.39

Data Processing:

Photoelectron Line

2p_1/2, sat

874.93

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

3.57

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu 3p3, 2p3 = 75.13, 932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The sample was cleaned by ion bombardment (Ep =3 keV, time = 5 min). Emission angle = 45 degrees. FAT mode. Analyzer pass energy = 4.45. Analyzer resolution = 0.067 eV. The relative intensity was 0.07.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300