NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 9

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

ScCu₂Si₂

CS-3d_5/2

0.60

ScCu₂Si₂

CS-2p_3/2

1.30

ScCu₂Si₂

CS-2p_3/2

0.50

YCu₂Si₂

CS-3d_5/2

0.50

YCu₂Si₂

CS-2p_3/2

0.80

YCu₂Si₂

CS-2p_3/2

0.20

CeCu₂Si₂

CS-3d_5/2

0.00

CeCu₂Si₂

CS-2p_3/2

0.50

CeCu₂Si₂

CS-2p_3/2

0.10

Data Processing:

Chemical Shift

CS-3d_5/2

0.50

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300