NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Al/Re

aluminum/rhenium

element

Citation:

Author Name(s):

Wu Y., Garfunkel E., Madey T.E.

Journal:

Surf. Sci. 365, 337

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

118.00

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Re4f7 = 40.34

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

1.3 ML Al/Re(0001) and 6.3 ML Al/Re(0001) . FAT mode. Emission angle = 12 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300