NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 6

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SnO₂

M₄N₄₅N₄₅

432.80

SnO₂

530.40

SnO₂

3d_5/2

486.60

SnO₂

3d_3/2

495.00

SnO₂

4d_5/2

25.90

SnO₂

4d_3/2

27.10

Data Processing:

Auger-Electron Line

M₄N₄₅N₄₅

432.80

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu 3p3, Ag, Cu = 75.13, 368.27, 932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The composition determined by XPS was Sn0.3373O0.6627. FAT mode. Emission angle An electron flood gun (Ep = 5 eV, Ip = 20 mA) was used for charge compensation.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300