NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 2

Data Processing:

Photoelectron Line

100.60

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.8

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag,Cu = 368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

n-type doped 6H-SiC(0001) with a carrier concentration of 3.8E18 cm-3. The composition determined by XPS was Si0.566C0.434. The spectra were recorded at normal emission.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300