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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
C
Formula:
CH3Si((C6H5)2)OSi(CH3)(C6H5)OSi((C6H5)2)CH3
Name:
pentaphenyltrimethylsiloxane
CAS Registry No:
3390-61-2
Class:
oxygen, phenyl benzene

Citation:
Author Name(s):
Beamson G., Clark D.T., Hayes N.W., Law D.S.-L.
Journal:
Surf. Sci. Spectra 3, 366
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s, sat
Binding Energy (eV)
291.60
Energy Uncertainty:
Background Subtraction Method:
Linear
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
1.09
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag3d5 = 368.27
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
FAT mode. The spectra were recorded at normal emission. Peak locations: Voigt function. The composition determined by XPS was Si0.083C0.856O0.061. The relative intensity was 0.04.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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