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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
zinc selenide
chalcogenide, II-VI semiconductor, selenide

Citation:
Yang F., Ban D., Fang R., Xu P., Xu S., and Yuan S.
J. Electron Spectrosc. Relat. Phenom. 80, 193
Pub Year:
1996

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
other source
X-ray Energy:
85
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
ZnSe(100). The sample was cleaned by Ar+ ion bombardment (Ep = 900 eV, time = 10 min) and subsequently annealed (T = 673 K, time = 12 min) for several cycles.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300

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