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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Summary Page
Tab Page Summary
General:
Element:
Se
Formula:
ZnSe
Name:
zinc selenide
CAS Registry No:
1315-09-9
Class:
chalcogenide, II-VI semiconductor, selenide
Citation:
Author Name(s):
Yang F., Ban D., Fang R., Xu P., Xu S., and Yuan S.
Journal:
J. Electron Spectrosc. Relat. Phenom. 80, 193
DOI:
10.1016/0368-2048(96)02954-4
Pub Year:
1996
book
All Records in this Publication
Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d
5/2
Binding Energy (eV)
52.73
Energy Uncertainty:
0.1
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
85
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
ZnSe(100). The sample was cleaned by Ar+ ion bombardment (Ep = 900 eV, time = 10 min) and subsequently annealed (T = 673 K, time = 12 min) for several cycles.
Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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