NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-(CH(C(O)NH₂)CH₂)k^-(CH(C(O)NH(CH₂)₃N(CH₃)₃Cl)CH₂)m^-)n

XPS Formula:

(^-(C*H(C(O)NH₂)CH₂)k^-(C*H(C(O)NHCH₂CH₂CH₂N(CH₃)₃Cl)CH₂)m^-)n

Name:

poly(acrylamide-co-(3-(acryloylamino) propyltrimethylammoniumchloride))

CAS Registry No:

Class:

amide

Citation:

Author Name(s):

Baumgarten E., Fiebes A., Stumpe A., Ronkel F., Schultze J.W.

Journal:

J. Molecular Catal. A 113, 469

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

285.10

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.9

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The relative intensity was 0.130.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300