NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Bi

Bi/CuO/SrTiO₃

bismuth/copper oxide/strontium titanate

CAS Registry No:

7440-69-9

element

Citation:

Author Name(s):

Conard T., Sporken R., Ghijsen J., Yu L.M., Caudano R., Seemann R., et al.

Surf. Sci. 369, 177

Pub Year:

1996

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

5d_5/2

Binding Energy (eV)

25.60

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

70

Overall Energy Resolution (eV):

0.25

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

<0.5 A Bi/8 A Cu/SrTiO3(100) was oxidized with atomic oxygen. The thickness was measured using a quartz-crystal thickness monitor. Branching ratio = 0.75.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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