NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 7

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Bi/CuO/SrTiO₃

DS-5d

3.05

Bi/CuO/SrTiO₃

5d_5/2

23.90

Bi/CuO/SrTiO₃

5d_5/2

25.60

Bi/CuO/SrTiO₃

5d_5/2

23.60

Bi/CuO/SrTiO₃

5d_5/2

25.70

Bi/Ni

5d_5/2

23.40

Bi₂Sr₂CaCu₂O₈⁺x

5d_5/2

25.40

Data Processing:

Data Type:

Doublet Separation for Photoelectron Lines

Line Designation:

DS-5d

Double Separation (eV)

3.05

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.25

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

<0.5 A and 4 A Bi/8 A Cu/SrTiO3(100) were oxidized with atomic oxygen. The thickness was measured using a quartz-crystal thickness monitor. Branching ratio = 0.75.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300