NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 15

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

H₂O/Si

CS-2p_3/2

0.22

H₂O/Si

CS-2p_3/2

0.90

O₂/Si

CS-2p_3/2

0.93

O₂/Si

CS-2p_3/2

1.76

O₂/Si

CS-2p_3/2

2.51

O₂/Si

CS-2p_3/2

3.50

O₂/Si

DS-2p

0.60

H₂O/Si

DS-2p

0.60

DS-2p

0.60

H₂O/Si

INT-2p_3/2

0.06

H₂O/Si

SS-2p_3/2

0.00

SS-2p_3/2

0.00

SS-2p_3/2

0.08

SS-2p_3/2

-0.57

SS-2p_3/2

0.77

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-2p_3/2

Surface Core-Level Shift (eV)

-0.57

Energy Uncertainty:

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.450

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

135

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Si(113)-(3x2). FAT mode. The spectra were recorded at normal emission and 40 degrees. Branching ratio = 0.52. The relative intensity was 0.11.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300