NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 11

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

H₂/W

4f_7/2

31.41

H₂/W

4f_7/2

31.41

4f_7/2

31.41

SS1-4f_7/2

-0.37

SS1-4f_7/2

-0.14

H₂/W

SS1-4f_7/2

-0.22

H₂/W

SS1-4f_7/2

-0.22

H₂/W

SS2-4f_7/2

-0.10

H₂/W

SS2-4f_7/2

-0.10

H₂/W

SS3-4f_7/2

0.09

H₂/W

SS3-4f_7/2

0.09

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS1-4f_7/2

Surface Core-Level Shift (eV) for the first Layer of Atoms

-0.37

Energy Uncertainty:

0.01

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.220

Lorentzian Width (eV):

0.55

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.22

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

W(100)c(2x2). The sample was leaned by repeated heating to 1800 K in 1E-6 Torr O2 and flashing in vacuum to 2400 K. Peak locations: Doniach - Sunjic & Gaussian.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300