NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

CuO

copper(II) oxide

1317-38-0

catalyst, oxide

Citation:

Author Name(s):

Hartmann A., Russell G.J., Matthews D.N., Cochrane J.W.

Journal:

Surf. Interface Anal. 24, 657

DOI:

Pub Year:

1996

book All Records in this Publication

Data Processing:

Photoelectron Line

529.60

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The crystal was vacuum annealed (T = 823 K, time = 24 h). FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300