NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

TaS₂

tantalum disulfide

12143-72-5

chalcogenide, sulfide

Citation:

Author Name(s):

Hernan L., Morales J., Sanches L., Tirado J.L., Espinos J.P., et al.

Journal:

Chem. Mater. 7, 1576

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Photoelectron Line

161.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.6

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

Mg/Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300