NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

SnO

tin(II) oxide

21651-19-4

oxide

Citation:

Author Name(s):

Kover L., Moretti G., Kovacs Z., Sanjines R., Cserny I., et al.

Journal:

J. Vac. Sci. Technol. A 13, 1382

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Data Type:

Chemical Shift

Line Designation:

CS-AP-3d_5/2,M4N45N45

Chemical Shift (eV)

-2.30

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300