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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Sn
Formula:
SnO1.39
Name:
tin oxides (SnO1.39)
CAS Registry No:
Class:
non-stoichiometric oxide, oxide

Citation:
Author Name(s):
Choi W.-K., Jung H.-J., Koh S.-K.
Journal:
J. Vac. Sci. Technol. A 14, 359
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d3/2
Binding Energy (eV)
494.81
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The thin films were grown by a reactive ion assited deposition onto Si(100) and glass substrates. The sample was cleaned by Ar+ ion bombardment (Ep = 4 keV, Ip = ~ 5 mA, time = 60 s). An electron flood gun (Ep = 4 eV) was used for charge compensation.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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