NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 5

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiO

CS-AP-1s,KL23L23(1D)

3.10

SiO₂

CS-AP-1s,KL23L23(1D)

3.80

SiC

CS-AP-1s,KL23L23(1D)

0.10

SiC

CS-AP-1s,KL23L23(1D)

0.20

Si₃N₄

CS-AP-1s,KL23L23(1D)

1.90

Data Processing:

Chemical Shift

CS-AP-1s,KL23L23(1D)

0.20

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other anode

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Element

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The sample was cleaned by Ar+ ion bombardment (Ep = 3 keV, j = 4 microamperes cm-2, time = 5 min). FAT mode. Hexagonal structure.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300