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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
GeSe2
germanium diselenide
12065-11-1
chalcogenide, glass, II-VI semiconductor, IV-VI semiconductor, selenide

Citation:
Kandil K.M., Kotkata M.F., Theye M.L., Gheorghiu A., Senemaud C., and Dixmier J.
Phys. Rev. B 51, 17565
Pub Year:
1995

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
0.5
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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