NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

antimony

7440-36-0

element, II-VI semiconductor

Citation:

Author Name(s):

Liu W.K., Yuen W.T., Stradling R.A.

Journal:

J. Vac. Sci. Technol. B 13, 1539

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Photoelectron Line

3d_3/2

538.00

0.5

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300