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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
In
Formula:
InSb
Name:
indium stibnide
CAS Registry No:
1312-41-0
Class:
II-VI semiconductor, III-V semiconductor, intermetallic, stibnide

Citation:
Author Name(s):
Varekamp P.R., Hakansson M.C., Kanski J., Shuh D.K., Bjorkqvist M., Gothelid M., et al
Journal:
Phys. Rev. B 54, 2101
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Surface Core-level Shift for the Second Layer of Atoms
Line Designation:
SS1-4d5/2
Surface Core-Level Shift (eV) for the first Layer of Atoms
-0.28
Energy Uncertainty:
Background Subtraction Method:
Linear
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
0.13

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
82.96
Overall Energy Resolution (eV):
0.2
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
InSb(001)-c(8x2). The spectra were recorded at normal emission.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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