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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
F
Formula:
Si0.255Zr0.072O0.665F0.008
XPS Formula:
fluorine atoms attached to Zr
Name:
silicon zirconium oxide fluoride (Si0.255Zr0.072O0.665F0.008)
CAS Registry No:
Class:
catalyst, fluoride, oxide

Citation:
Author Name(s):
Bosman H.J.M., Pijpers A.P., Jaspers A.W.M.A.
Journal:
J. Catal. 161, 551
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
685.40
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Ag,Cu = 84.00,368.27,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The catalyst was prepared by hydrolysis of mixture of H2SiF6 and H2ZrF6 using ammonia at a constant pH of 9.0. The resulting precipitate was subsequently filtered, washed, dried (T= 373 K), and calcined (T = 773 K). FAT mode.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Photoelectron Spectroscopy
Specimen Temperature (K):
300
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