NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

TiO₂

titanium(IV) dioxide

13463-67-7

catalyst, IV-VI semiconductor, mineral, oxide

Citation:

Author Name(s):

Larsson P.-O., Anderson A., Wallenberg L.R., Svensson B.

Journal:

J. Catal. 163, 279

DOI:

Pub Year:

1996

book All Records in this Publication

Data Processing:

Photoelectron Line

530.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.4

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Anatase. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300