NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 6

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

(^-Si(CH₃)₂O^-)n

532.80

(^-Si(CH₃)₂O^-)n

102.50

(Si(CH₃)(C₆H₅)^-O^-)n

532.50

(Si(CH₃)(C₆H₅)^-O^-)n

102.10

SiO₂

532.40

SiO₂

103.20

Data Processing:

Photoelectron Line

102.50

0.07

Background Subtraction Method:

Linear

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode. Emission angle = 55 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300