NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C

C₁₀H₄N₂O₄/Ag

interface carbons

pyromellitic diimide/silver

CAS Registry No:

2550-73-4

amide, imide, other ring, oxygen, phenyl benzene

Citation:

Author Name(s):

Timbrell P.Y., Than-Trong N., Lamb R.N.

Colloids Surf. A 93, 181

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

287.70

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

FAT mode. Emission angle = 60 degrees. The intensity ratio of the Gaussian/Lorentzian components was 50/50. The film thickness determined by XPS was ~7 A. The relative intensity was 0.046.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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