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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
S
Formula:
[Pt2(P(C6H5)3)4SSCH3]I
XPS Formula:
[Pt2(P(C6H5)3)4SS*CH3]I
Name:
diplatinum tetrakis(triphenylphosphine) mu-sulfide mu-methylsulfide iodide
CAS Registry No:
Class:
organometallic, phenyl benzene, sulfur

Citation:
Author Name(s):
Aw B.H., Look K.K., Chan H.S.O., Tan K.L., Hor T.S.A.
Journal:
J. Chem. Soc. Dalton Trans. 3177
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
162.90
Energy Uncertainty:
0.3
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
1.8
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
[Pt2(P(C6H5)3)4(mu-S)(mu-SCH3)]I. FRR mode. No radiation damage was detected.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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