NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[N(C₃H₅)₄][ReCl₅(NH₂CSNH₂)]

XPS Formula:

((C₃H₅)₄N*)[ReCl₅(NH₂CSNH₂)]

Name:

tetrapropylammonium pentachlorothiourearhenate

CAS Registry No:

Class:

chloride, nitrogen, organometallic, rhenate, substituted ammonium, sulfur, thiourea

Citation:

Author Name(s):

Srinivasan R., Walton R.A.

Journal:

Inorg. Chim. Acta 25, L85

DOI:

Pub Year:

1977

book All Records in this Publication

Data Processing:

Photoelectron Line

401.50

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):