NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Cr/InSb

XPS Formula:

surface segregated In

Name:

chromium/indium stibnide

CAS Registry No:

Class:

IV-VI semiconductor, stibnide

Citation:

Author Name(s):

Boscherini F., Shapira Y., Capasso C., Aldao M., Weaver J.H.

Journal:

J. Vac. Sci. Technol. B 5, 1003

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-4d

Interface Core-Level Shift

-0.62

Energy Uncertainty:

0.05

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

4.2 A and 9 A Cr/InSb(110). The energy is referenced to the bulk state of the In4d line

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300