NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

O

SiO₂,quartz

silicon(IV) dioxide (Quartz)

CAS Registry No:

60676-86-0

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:

Author Name(s):

Gorlich E., Haber J., Stoch A., Stoch J.

J. Solid State Chem. 33, 121

Pub Year:

1980

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Total Records: 3

Data Processing:

Photoelectron Line

Line Designation:

1s

Binding Energy (eV)

533.30

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Gold

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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