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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
W
Formula:
Na2[W2(O)2(muO)(muS)(mu(O(O)CCH2)2NCH2CH2N(CH2C(O)O))]
XPS Formula:
Na2[W*2(O)2(muO)(muS)(mu(O(O)CCH2)2NCH2CH2N(CH2C(O)O))]
Name:
disodium (mu-oxo)(mu-N,N'-ethylenediaminetetraacetato) (mu-sulfido) bis(oxotungstate)
CAS Registry No:
Class:
acetate, alkali, amide, cluster, ethylenediaminetetraacetate, organometallic, tungstate

Citation:
Author Name(s):
Ikari S., Sasaki Y., Ito T.
Journal:
Inorg. Chem. 28, 447
DOI:
Pub Year:
1989

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4f5/2
Binding Energy (eV)
35.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Samples were prepared as thin films on Al.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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