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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
W
Formula:
((C2H5)4N)2[S2W(O)(muS)2W(O)S2]
XPS Formula:
((C2H5)4N)2[S2W*(O)(muS)2W*(O)S2]
Name:
bis(tetraethylammonium) bis(mu-thio) bis(dithioperoxo) bis(oxotungstate)
CAS Registry No:
Class:
cluster, organometallic, oxygen ligand, sulfur ligand

Citation:
Author Name(s):
Ansari M.A., Chandrasekaran J., Sarkar S.
Journal:
Polyhedron 7, 471
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4f7/2
Binding Energy (eV)
33.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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