NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[ReCl(N₂)((CH₃)₂P(C₆H₅))₄]

XPS Formula:

[ReClN*N((CH₃)₂P(C₆H₅))₄]

Name:

chlorotetrakis(dimethylphenylphosphine)(dinitrogen)rhenium

CAS Registry No:

27970203

Class:

chloride, nitrogen ligand, organometallic, phenyl benzene, phosphorous

Citation:

Author Name(s):

Chatt J., Elson C.M., Hooper N.E., Leigh G.J.

Journal:

J. Chem. Soc. Dalton Trans. 2392

DOI:

Pub Year:

1975

book All Records in this Publication

Data Processing:

Photoelectron Line

399.90

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):