NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

((C₂H₅)₄N)₂[(SC=(C(O)C₆H₅)C(C(O)C₆H₅)S)W(O)(muS)₂W(O)(SC=(C(O)C₆H₅)C(C(O)C₆H₅)S)]

XPS Formula:

((C₂H₅)₄N)₂[(S*C=(C(O)C₆H₅)C(C(O)C₆H₅)S*)W(O)(muS*)₂W(O)(S*C=(C(O)C₆H₅)C(C(O)C₆H₅)S*)]

Name:

bis(tetraethylammonium) bis(mu-thio) bis(1,2-dibenzoyl-1,2-dimercapto-ethylene) bis(oxotungstate)

CAS Registry No:

Class:

cluster, organometallic, oxygen, oxygen ligand, phenyl benzene, sulfur, sulfur ligand

Citation:

Author Name(s):

Ansari M.A., Chandrasekaran J., Sarkar S.

Journal:

Polyhedron 7, 471

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Photoelectron Line

226.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300