NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

CH₃C(O)CH₂C=(CH₃)NCH₂CH₂N=C(CH₃)CH₂C(O)CH₃

XPS Formula:

CH₃C(O)CH₂C=(CH₃)N*CH₂CH₂N*=C(CH₃)CH₂C(O)CH₃

Name:

4,4'-(ethylenediimino)-bis(pentan-2-one)

CAS Registry No:

Class:

ethanediamine, ketone, nitrogen, oxygen, pentadionato

Citation:

Author Name(s):

Khan M.M.T., Srivastava S.

Journal:

Polyhedron 7, 1063

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Photoelectron Line

400.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

3.1

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The powdered sample was mixed with higher purity silver powder to reduce the charging effect.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300