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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
S
Formula:
CF3SSOOCH3
XPS Formula:
CF3SS*OOCH3
Name:
trifluoromethyl(thiomethylsulfonate-S)
CAS Registry No:
15398977
Class:
fluoride, halogenated compound, oxygen, sulfite, sulfur

Citation:
Author Name(s):
Lindberg B.J., Hamrin K., Johansson G., Gelius U., Fahlmann A., Nordling C., Siegbahn K.
Journal:
Phys. Scripta 1, 286
DOI:
Pub Year:
1970

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
169.00
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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