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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
O
Formula:
[Cu(S2CN(C3H7)2)2]ClO4
XPS Formula:
[Cu(S2CN(C3H7)2)2]ClO*4
Name:
copper(III) bis(diisopropyl dithiocarbamate) perchlorate
CAS Registry No:
Class:
dithoic acid, nitrogen, organometallic, sulfur

Citation:
Author Name(s):
Healy P.C., Myhra S., Stewart A.M.
Journal:
Jpn. J. Appl. Phys. Part 2 26, L1884
DOI:
Pub Year:
1987

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
531.80
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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