NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 4

Data Processing:

Photoelectron Line

2p_3/2

102.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Si2p = 99.34

Charge Reference:

Element

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

3.2 nm Pd/SiOx/Si(111). Si(111) (p-type, boron doped with 6 Ohm cm resistivity) crystals covered with native oxide (thickness, d=2nm) and Pd. Coverages were monitored by a quartz crystall oscillator.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

100