NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[^-C₈H₃NO₂^-C(CF₃)₂^-C₈H₃NO₂^-C₆H₄^-O^-C₆H₄^-]n

XPS Formula:

(^-N*=(C(O))₂=(C₆H₃)^-C(CF₃)₂^-(C₆H₃)=(C(O))₂=N*^-(C₆H₄)^-O^-(C₆H₄)^-)n

Name:

4,4'-hexafluoroisopropylidene-bis-phthalic acid anhydride-oxydianiline polyimide

CAS Registry No:

Class:

aniline, halogenated compound, imide, multiple rings, nitrogen, oxygen, phenyl benzene, polymer

Citation:

Author Name(s):

Buchwalter L.P., Silverman B.D., Witt L., Rossi A.R.

Journal:

J. Vac. Sci. Technol. A 5, 226

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Photoelectron Line

400.60

0.2

Background Subtraction Method:

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.4

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

A flood gun was used for charge neutralization.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300