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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Cu
Formula:
CuS
Name:
copper sulfide
CAS Registry No:
1317-40-4
Class:
chalcogenide, II-VI semiconductor, IV-VI semiconductor, mineral, sulfide

Citation:
Author Name(s):
Klein J.C., Proctor A., Hercules D.M., Black J.F.
Journal:
Anal. Chem. 55, 2055
DOI:
Pub Year:
1983

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
932.30
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Two-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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