NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 538

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

(^-CH₂CH(C₆H₄Br)^-)n

3d_5/2

70.50

(^-CH₂CH(OH)^-)n

532.74

(^-CH₂CH(C(O)OCH₃)^-)n

533.69

(^-CH₂CH(C(O)OCH₃)^-)n

289.04

(^-CH₂CH(C(O)OCH₃)^-)n

285.41

(^-CH₂CH(C(O)OCH₃)^-)n

532.21

(^-CH₂CH(C(O)OCH₃)^-)n

286.59

(^-CH₂CH(C₆H₄CH₂N(CH₃)₃(Cl))^-)n

2p_3/2

196.65

(^-CH₂CH(CH₂NH₃Cl)^-)n

2p_3/2

197.70

(^-C₆H₄S^-)n

2p_3/2

163.66

(^-CH₂CH(Cl)^-)n

2p_3/2

200.64

(^-C^-HCH₃) (partial unit)

2p_3/2

200.81

(^-CCl₂CH₂^-)n

2p_3/2

200.78

(^-PN^-(OC₆H₅)₂)n

2p_3/2

133.85

(Si(CH₃)(C₆H₅)^-O^-)n

2p_3/2

101.68

(^-CH₂((CH₂)₄)CH₂S(O)(O)^-)n

2p_3/2

167.64

(^-CH₂CHC(Cl)CH₂^-)n

2p_3/2

200.63

(^-CH₂C(CH₃)(C(O)OCH₂CH₂Cl)^-)n

2p_3/2

200.53

(^-Si(CH₃)₂O^-)n

2p_3/2

101.79

(^-C₆H₄OC₆H₄S(O)(O)^-)n

2p_3/2

167.57

(^-CH₂CH(C₆H₄Cl)^-)n

2p_3/2

200.50

(^-CH₂CH(C₆H₄S(O)(O)ONa)^-)n

2p_3/2

168.23

(^-CH₂CH(C₆H₄Cl)^-)n

2p_3/2

200.44

(^-CH₂CHCl^-) (partial unit)

2p_3/2

200.80

(^-CH₂CHSH^-)n

2p_3/2

163.50

(^-CH₂CH(C₆H₄Cl)^-)n

2p_3/2

200.53

(^-CH₂C(CH₃)(C(O)OCH₃)^-)n

533.77

(^-CH₂C(CH₃)(C(O)OH)^-)n

532.39

(^-CH₂C(CH₃)(C(O)OH)^-)n

533.78

(^-CH₂CH(OCH₂CH(CH₃)₂)^-)n

286.30

Data Processing:

Photoelectron Line

2p_3/2

200.80

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):