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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ca
Formula:
CaF2/Si
XPS Formula:
Ca*F2/Si
Name:
calcium(II) difluoride/silicon
CAS Registry No:
7789-75-5
Class:
alkaline earth, fluoride

Citation:
Author Name(s):
Rieger D., Himpsel F.J., Karlsson U.O., McFeely F.R., Morar J.F., and Yarmoff J.A.
Journal:
Phys. Rev. B 34, 7295
DOI:
Pub Year:
1986

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3p
Binding Energy (eV)
26.00
Energy Uncertainty:
0.3
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Submonolayer coverage and 1.4 ML and 2.5 ML CaF2/Si(111)-(7x7), n-type P-doped with 5 Ohm cm resistivity. CaF2 was deposited at 923-973 K. The thickness was determined by XPS

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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