NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

HOOCCH(NH₂)CH₂SSCH₂CH(NH₂)COOH

S*CH₂

cystine-S

56-89-3

amine, amino acid/its derivatives, carboxylic acid, nitro(so), organic acid, oxygen, sulfur

Citation:

Author Name(s):

Yu X.-R., Liu F., Wang Z.-Y., Chen Y.

Journal:

J. Electron Spectrosc. Relat. Phenom. 50, 159

DOI:

Pub Year:

1990

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

162.95

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5=368.2

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):