NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 10

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

CaF₂/Si

INT-3p

2.00

CaF₂/Si

INT-3s

1.80

CaF₂/Si

INT-2p_3/2

2.10

CaF₂/Si

28.00

CaF₂/Si

47.00

CaF₂/Si

31.80

CaF₂/Si

29.90

CaF₂

31.80

CaF₂/Si

26.00

CaF₂/Si

45.20

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-2p_3/2

Interface Core-Level Shift

2.10

Energy Uncertainty:

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1.4 ML and 2.5 ML CaF2/Si(111)-(7x7), n-type P-doped with 5 Ohm cm resistivity. CaF2 was deposited at 923-973 K. The thickness was determined by XPS

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300