NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Rh₂(CH₃COSH)₂(CH₃COS)₄]

Name:

tetrakis(mu-thioacetato-O,S)bis(thioacetic acid)dirhodium

CAS Registry No:

56214585

Class:

acid, ethanethioato, organic acid, organometallic, sulfur

Citation:

Author Name(s):

Baranovski I.B., Golubnichaya M.A., Mazo G.Ya., Nefedov V.I., Salyn Ya.V., Shchelokov R.N.

Journal:

Zh. Neorg. Khimii 21, 1085

Pub Year:

1976

book All Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

308.60

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):