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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
O
Formula:
SnO2
XPS Formula:
lattice oxygen atoms in SnO2
Name:
tin(IV) dioxide
CAS Registry No:
18282-10-5
Class:
anhydride, oxide

Citation:
Author Name(s):
Badrinarayanan S., Mandale A.B., Gunjikar V.G., Sinha A.P.B.
Journal:
J. Mater. Sci. 21, 3333
DOI:
Pub Year:
1986

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
531.00
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00, Sn3d5 =484.98
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
SnSe was heated in air for 120 min at 760 Torr pressure (T=923 K). in SnSeOx system

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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