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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
N
Formula:
(C6H5)C(NOH)C(H)2N(H)S(O2)(C6H5)
XPS Formula:
(C6H5)C(NOH)C(H)2N*(H)S(O2)(C6H5)
Name:
N-(2-hydroxyimino-2-phenyl-ethyl)-benzenesulfonamide
CAS Registry No:
Class:
nitrogen, oxygen, phenyl benzene, sulfonyl, sulfur

Citation:
Author Name(s):
Doring M., Rudolph M., Uhlig E., Nefedov V.I., Salyn I.V.
Journal:
Z. Anorg. Allg. Chem. 532, 65
Pub Year:
1986

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
399.00
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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