NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 15

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

HC(O)OH/MgO/Mg

286.80

CH₃C(O)OH/MgO/Mg

287.00

CH₃C(O)OH/MgO/Mg

290.40

CH₃OH/MgO/Mg

289.10

CH₃OH/MgO/Mg

287.90

C₂H₅OH/MgO/Mg

287.50

MgO/Mg

51.10

HC(O)OH/MgO/Mg

290.40

C₂H₅OH/MgO/Mg

286.90

C₂H₅OH/MgO/Mg

288.00

HC(O)^-O^-CH₃/MgO/Mg

287.80

HC(O)^-O^-CH₃/MgO/Mg

290.50

C₂H₂/MgO/Mg

285.60

C₂H₂/MgO/Mg

285.00

C₂H₂/MgO/Mg

286.40

Data Processing:

Photoelectron Line

285.60

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

3.2

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Mg2p3=49.79

Charge Reference:

Element

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Adsorption of C2H2 onto MgO thin films which were formed on the Mg(0001) single crystal (99.999 % purity) surface by a ~100 L exposure to O2.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

170