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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Sn
Formula:
Sn
Name:
tin
CAS Registry No:
7440-31-5
Class:
element

Citation:
Author Name(s):
Parry-Jones A.C., Weightman P., Andrews P.T.
Journal:
J. Phys. C. 12, 1587
DOI:
Pub Year:
1979

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4d
Binding Energy (eV)
24.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Onset of secondary emission
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:
On = onset of secondary emission

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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